Representatives from ISSP UL Laboratory of Optical Materials and Laboratory of Materials Morphology and Structure Investigations visited FEI Europe B.V. in Eindhoven, Netherlands on September 26 - 28. The aim of the visit was to get information about FEI Helios G5 UX microscope and experiment with test samples.
FEI is the world leader in electron optics and focused ion beam technologies. Our market-leading solutions deliver precision imaging for three-dimensional characterization, analysis and modification of materials and structures with resolution down to the sub-Ångström level.
The Thermo Scientific™ Helios™ 5 UX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of scientists and engineers, combining the innovative Elstar™ electron column with high-current UC+ technology for extreme high-resolution imaging and the highest materials contrast with the superior Thermo Scientific™ Phoenix™ Focused Ion Beam (FIB) Column for the fastest, easiest and most precise high-quality sample preparation.